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American Mineralogist; August 1983; v. 68; no. 7-8; p. 840-844
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The SEM examination of geological samples with a semiconductor backscattered-electron detector; discussion and reply

Bruce W. Robinson, Ernest H. Nickel, M. G. Hall, and G. E. Lloyd

CSIRO, Div. Mineral., Wembley, W.A., Australia

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