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American Mineralogist; October 1983; v. 68; no. 9-10; p. 944-950
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Quantitative study of Al-Si ordering in an orthoclase feldspar using an analytical transmission electron microscope

J. Tafto, and Peter R. Buseck

Ariz. State Univ., Dep. Phys., Tempe, AZ, United States

Electron-induced X-ray emission produces anomalous intensities as a result of electron channeling; these intensities can be used to determine directly the chemical compositions of specific crystallographic sites within individual crystals.--Modified journal abstract.

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