Quick
Search: 		  
advanced search
 GSW Home   GeoRef Home   My GSW Alerts   Contact GSW   About GSW   Journals List   Help 
American Mineralogist Email Content Delivery
JOURNAL HOME HELP CONTACT PUBLISHER SUBSCRIBE ARCHIVE SEARCH TABLE OF CONTENTS
American Mineralogist; October 1993; v. 78; no. 9-10; p. 893-903
This Article
Right arrow Alert me when this article is cited
Right arrow Alert me if a correction is posted
Services
Right arrow Email this article to a friend
Right arrow Similar articles in this journal
Right arrow Alert me to new issues of the journal
Right arrow Download to citation manager
Right arrow Order Hardcopy of Full Text via AGI/GeoRef
Citing Articles
Right arrow Citing Articles via HighWire
Right arrow Citing Articles via Google Scholar
Google Scholar
Right arrow Articles by Czamanske, G. K.
Right arrow Articles by Teesdale, W. J.
Right arrow Search for Related Content
GeoRef
Right arrow GeoRef Citation

Micro-PIXE analysis of silicate reference standards

Gerald K. Czamanske, Thomas W. Sisson, John L. Campbell, and William J. Teesdale

U. S. Geological Survey, Menlo Park, CA, United States

This record provided courtesy of AGI/GeoRef.




This article has been cited by other articles:


Home page
 J PetrologyHome page
M.-L. FREZZOTTI, A. PECCERILLO, V. ZANON, and I. NIKOGOSIAN
Silica-rich Melts in Quartz Xenoliths from Vulcano Island and their Bearing on Processes of Crustal Anatexis and Crust-Magma Interaction beneath the Aeolian Arc, Southern Italy
J. Petrology, January 1, 2004; 45(1): 3 - 26.
[Abstract] [Full Text] [PDF]

Home page
 Eur J MineralHome page
T. H. HANSTEEN, P. M. SACHS, and F. LECHTENBERG
Synchrotron-XRF microprobe analysis of silicate reference standards using fundamental-parameter quantification
European Journal of Mineralogy, February 1, 2000; 12(1): 25 - 31.
[Abstract] [Full Text] [PDF]


JOURNAL HOME HELP CONTACT PUBLISHER SUBSCRIBE ARCHIVE SEARCH TABLE OF CONTENTS
Copyright © 2008 by Mineralogical Society of America