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American Mineralogist; October 1996; v. 81; no. 9-10; p. 1133-1140
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Quantitative analysis of alkali feldspar minerals using Rietveld refinement of X-ray diffraction data

Sang-Heon Shim, Soo Jin Kim, and Jung Ho Ahn

Seoul National University, Department of Geological Sciences, Seoul, South Korea

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